14 Apr 2017

LatticeGear is heading to Semicon SEA

LatticeGear is heading to Semicon SEA to participate in the workshop: Effective Failure Analysis in the age of Internet-of-Things (IoT) chaired by Dr. GOH Szu Huat of Global Foundries, Singapore Pte Ltd. Learn more about the workshop and register here https://lnkd.in/eaXPYN3

Here is the conference abstract:

In today’s age of IoT proliferation, people are more connected than ever in their daily activities by a broad array of systems and sensors found in smartphones, tablets, electric cars, visuals or wearables. By the year 2020, according to various sources, it is estimated that about 50 to 100 billion devices will be electronically connected to the internet. To support this exponential growth, integrated circuits and package modules technologies that are found in such IoT devices is advancing at a pace that is so rapid that it is important for failure analysis approaches to keep up with the changes. It is no longer how well we debug failures but how fast we resolve the issues. Employing the most effective diagnostic methodology and tool is critical to ensure quality and timely failure root cause analysis.

04 Apr 2017

Niels Bohr Institute Researchers Successfully Cleave Delicate Nanostructures

Scientists in the Quantum Photonics Group at the Niels Bohr Institute of the University of Copenhagen who are developing new technologies for photonic and quantum-information applications used the LatticeAx to alleviate one of their biggest sample preparation challenges: precise cleaves on small samples without damaging delicate fabricated nanostructures. Scientists are engaged in leading edge research to investigate the quantum interactions between light and nanophotonic semiconductor materials. They needed a way to cleave small sample without damaging the delicate devices. Cleaving using hand held scribers and cleaving tools did not produce the quality needed but the LatticeAx 420 cleaving system was able to do the job.

More..

© 2017 LatticeGear. All rights reserved.